Approaching the ideal elastic strain limit in silicon nanowires
Author(s) -
Hongti Zhang,
J. Tersoff,
Shang Xu,
Huixin Chen,
Qiaobao Zhang,
Kaili Zhang,
Yong Yang,
ChunSing Lee,
K. N. Tu,
Ju Li,
Yang Lü
Publication year - 2016
Publication title -
science advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.928
H-Index - 146
ISSN - 2375-2548
DOI - 10.1126/sciadv.1501382
Subject(s) - materials science , nanowire , nanoelectronics , silicon , elasticity (physics) , brittleness , composite material , semiconductor , strain engineering , plasticity , nanotechnology , optoelectronics
Achieving high elasticity for silicon (Si) nanowires, one of the most important and versatile building blocks in nanoelectronics, would enable their application in flexible electronics and bio-nano interfaces. We show that vapor-liquid-solid–grown single-crystalline Si nanowires with diameters of ~100 nm can be repeatedly stretched above 10% elastic strain at room temperature, approaching the theoretical elastic limit of silicon (17 to 20%). A few samples even reached ~16% tensile strain, with estimated fracture stress up to ~20 GPa. The deformations were fully reversible and hysteresis-free under loading-unloading tests with varied strain rates, and the failures still occurred in brittle fracture, with no visible sign of plasticity. The ability to achieve this “deep ultra-strength” for Si nanowires can be attributed mainly to their pristine, defect-scarce, nanosized single-crystalline structure and atomically smooth surfaces. This result indicates that semiconductor nanowires could have ultra-large elasticity with tunable band structures for promising “elastic strain engineering” applications.
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