Open AccessNonlinearity parameters from measurement of acoustic radiation-induced static strains in silicon
Author(s) -
William T. Yost,
John H. Cantrell,
Peter Li
Publication year - 1985
Publication title -
the journal of the acoustical society of america
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.619
H-Index - 187
eISSN - 1520-8524
pISSN - 0001-4966
DOI - 10.1121/1.2022360
Subject(s) - amplitude , acoustic wave , radiation , nonlinear system , acoustic radiation , acoustic wave equation , stress (linguistics) , physics , acoustics , silicon , materials science , coupling (piping) , strain (injury) , energy (signal processing) , computational physics , optics , quantum mechanics , linguistics , philosophy , optoelectronics , medicine , metallurgy
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