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Satellite Material Contaminant Optical Properties
Author(s) -
B. E. Wood,
William T. Bertrand,
Bryan L. Seiber,
E. L. Kiech,
Patrick M. Falco,
Jim Holt
Publication year - 1990
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - Uncategorized
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.962867
Subject(s) - transmittance , materials science , outgassing , optical materials , infrared window , refractive index , optics , satellite , nonlinear optical , thin film , adhesive , infrared , remote sensing , composite material , optoelectronics , nonlinear system , nanotechnology , engineering , aerospace engineering , geology , layer (electronics) , physics , astronomy , quantum mechanics

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