Testing of CMOS devices in NIF's harsh neutron environment
Author(s) -
Alan T. Teruya,
P. M. Bell,
S. Burns,
C. Hagmann,
James Moody,
M. Richardson
Publication year - 2012
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.930132
Subject(s) - neutron , cmos , neutron imaging , photoelectric effect , image sensor , phosphor , cmos sensor , shot (pellet) , neutron flux , scintillator , neutron detection , materials science , optics , optoelectronics , physics , nuclear physics , detector , metallurgy
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