ESPI solution for defect detection in crystalline photovoltaic cells | Zendy

Ching-Chung Yin | Zendy; Tzu-Kuei Wen | Zendy

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ESPI solution for defect detection in crystalline photovoltaic cells

Author(s) -

Ching-Chung Yin,

Tzu-Kuei Wen

Publication year - 2011

Publication title -

proceedings of spie, the international society for optical engineering/proceedings of spie

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.192

H-Index - 176

eISSN - 1996-756X

pISSN - 0277-786X

DOI - 10.1117/12.905261

Subject(s) - materials science , photovoltaic system , electronic speckle pattern interferometry , crystalline silicon , deformation (meteorology) , silicon , speckle pattern , polycrystalline silicon , optics , solar cell , fabrication , optoelectronics , composite material , ecology , layer (electronics) , pathology , biology , thin film transistor , medicine , physics , alternative medicine

The yield of photovoltaic (PV) cells is often reduced by micro-defects in crystalline silicon substrates during fabrication. Common optical inspection for a thin crack in such a large silicon photovoltaic cell is extremely time-consuming and fails in efficiency. This study developed a method of using electronic speckle pattern interferometry (ESPI) for rapidly testing for cracks in an entire field of PV cells. Thermally induced flexural cell deformation was measured by optical configuration for ESPI measurement of out-of-plane deformations. Experimental results indicate that the speckle patterns correlating with thermal deformation of cell enable simultaneous estimation of crack size and location in both single- and poly-crystalline PV cells. This nondestructive detection method has potential applications in PV cell sorting.

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