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Metrology of IXO mirror segments
Author(s) -
Kai-Wing Chan,
M. Hong,
Timo T. Saha,
Wei Zhang
Publication year - 2011
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.894347
Subject(s) - metrology , optics , astronomical interferometer , angular resolution (graph drawing) , observatory , telescope , x ray optics , dimensional metrology , physics , calibration , interferometry , x ray telescope , computer science , astronomy , combinatorics , mathematics , x ray , quantum mechanics
For future x-ray astrophysics mission that demands optics with large throughput and excellent angular resolution, many telescope concepts build around assembling thin mirror segments in a Wolter I geometry, such as that originally proposed for the International X-ray Observatory. The arc-second resolution requirement posts unique challenges not just for fabrication, mounting but also for metrology of these mirror segments. In this paper, we shall discuss the metrology of these segments using normal incidence metrological method with interferometers and null lenses. We present results of the calibration of the metrology systems we are currently using, discuss their accuracy and address the precision in measuring near-cylindrical mirror segments and the stability of the measurements.

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