Optically sectioned imaging by oblique plane microscopy | Zendy

Sunil Kumar | Zendy; Ziduo Lin | Zendy; Alex Lyon | Zendy; Ken MacLeod | Zendy; Chris Dunsby | Zendy

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Optically sectioned imaging by oblique plane microscopy

Author(s) -

Sunil Kumar,

Ziduo Lin,

Alex Lyon,

Ken MacLeod,

Chris Dunsby

Publication year - 2011

Publication title -

proceedings of spie, the international society for optical engineering/proceedings of spie

Language(s) - Uncategorized

Resource type - Conference proceedings

SCImago Journal Rank - 0.192

H-Index - 176

eISSN - 1996-756X

pISSN - 0277-786X

DOI - 10.1117/12.873471

Subject(s) - optics , microscopy , optical microscope , microscope , materials science , optical axis , photobleaching , lens (geology) , light sheet fluorescence microscopy , cardinal point , oblique case , resolution (logic) , tilt (camera) , image plane , computer science , computer vision , physics , scanning confocal electron microscopy , artificial intelligence , scanning electron microscope , linguistics , philosophy , image (mathematics) , fluorescence , mechanical engineering , engineering

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