Multi-layer far-infrared component technology | Zendy

Robert E. Peale | Zendy; Justin W. Cleary | Zendy; Walter R. Buchwald | Zendy; Andrew R. Davis | Zendy; Sandy Wentzel | Zendy; Bill Stacy | Zendy; Oliver Edwards | Zendy

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Multi-layer far-infrared component technology

Author(s) -

Robert E. Peale,

Justin W. Cleary,

Walter R. Buchwald,

Andrew R. Davis,

Sandy Wentzel,

Bill Stacy,

Oliver Edwards

Publication year - 2010

Publication title -

proceedings of spie, the international society for optical engineering/proceedings of spie

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.192

H-Index - 176

eISSN - 1996-756X

pISSN - 0277-786X

DOI - 10.1117/12.861598

Subject(s) - materials science , optics , silicon , stack (abstract data type) , optoelectronics , layer (electronics) , reflection (computer programming) , infrared , optical filter , spectrometer , computer science , physics , nanotechnology , programming language

Multi-layer thin-film optics based on alternating sub-wavelength layers of silicon and air provide high index contrast to create improved components with just a few layers. Applications include ultra-high reflectivity mirrors, band-pass and band-blocking filters, anti-reflection coatings, and compact high-resolution Fabry-Perot spectrometers with broad freespectral- range. Such components may be integrated directly into airborne/satellite and man-portable sensing instrumentation. We demonstrate a process to produce ultrathin silicon optical elements with an integral raised spacer rim to provide the requisite air gap when these elements are combined directly into a Bragg stack. Laboratory measurements confirm theoretical design specifications. Individual elements may be stacked and bonded to form Bragg mirrors and other thin-film optics.

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