Sensitivity of VIIRS polarization measurements | Zendy

Eugène Waluschka | Zendy

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Sensitivity of VIIRS polarization measurements

Author(s) -

Eugène Waluschka

Publication year - 2010

Publication title -

proceedings of spie, the international society for optical engineering/proceedings of spie

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.192

H-Index - 176

eISSN - 1996-756X

pISSN - 0277-786X

DOI - 10.1117/12.861433

Subject(s) - polarizer , polarization (electrochemistry) , optics , sensitivity (control systems) , spectral sensitivity , remote sensing , materials science , environmental science , physics , geology , electronic engineering , engineering , birefringence , chemistry , wavelength

The design of an optical system typically involves a sensitivity analysis where the various lens parameters, such as lens spacing and curvatures, to name two parameters, are (slightly) varied to see what, if any, effect this has on the performance and to establish manufacturing tolerances. A similar analysis was performed for the VIIRS instruments polarization measurements to see how real world departures from perfectly linearly polarized light entering VIIRS effects the polarization measurement. The methodology and a few of the results of this polarization sensitivity analysis are presented and applied to the construction of a single polarizer which will cover the VIIRS VIS/NIR spectral range.

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