Fast identification of highly distorted images
Author(s) -
Taras Holotyak,
Slava Voloshynovskiy,
Fokko Beekhof,
Oleksiy Koval
Publication year - 2010
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.838962
Subject(s) - identification (biology) , computer science , reliability (semiconductor) , artificial intelligence , algorithm , projection (relational algebra) , random projection , image (mathematics) , computer vision , pattern recognition (psychology) , power (physics) , physics , botany , quantum mechanics , biology
In this paper, we consider a low complexity identification system for highly distorted images. The performance of the proposed identification system is analyzed based on the average probability of error. An expected improvement of the performance is obtained combining random projection transform and concept of bit reliability. Simulations based on synthetic and real data confirm the efficiency of the proposed approach
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