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Characterization of uncertainties when measuring metal cutting temperatures using infrared radiation thermography
Author(s) -
Eric P. Whitenton
Publication year - 2009
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.818799
Subject(s) - emissivity , thermography , nist , black body radiation , calibration , infrared , temperature measurement , metrology , measurement uncertainty , optics , remote sensing , materials science , polarization (electrochemistry) , radiation , computer science , physics , geology , chemistry , quantum mechanics , natural language processing
There are many error sources when using infrared radiation thermography to measure the temperature distribution of the tool, workpiece, and chip during metal cutting. It is important to understand how these error sources affect the measurement uncertainty. Some are familiar to anyone performing thermography measurements, such as uncertainties in the basic camera calibration. However, metal cutting presents unique measurement challenges due to factors such as the high magnification required, high surface speeds, polarization effects, micro-blackbody effects, and changing emissivity as chips form. This paper presents highlights of the current state of efforts at NIST to catalog and characterize error sources and the resulting uncertainties.

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