An effective multiscale approach for deformation analyses of carbon nanotube-based nanoswitches
Author(s) -
Yuantong Gu,
Andy Tan,
Prasad Yarlagadda
Publication year - 2008
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.813893
Subject(s) - van der waals force , nonlinear system , materials science , carbon nanotube , deformation (meteorology) , discretization , nanotube , computer science , multiscale modeling , inertia , modulus , electrostatics , mechanics , classical mechanics , nanotechnology , composite material , physics , computational chemistry , mathematical analysis , chemistry , mathematics , quantum mechanics , molecule
This paper aims to develop an effective multiscale simulation technique for the deformation analysis of nanotube-based nanoswitches. In the multiscale simulation, the key material parameters, (e.g., Young's modulus and moment of inertia) are extracted from the MD simulation which can explore the atomic properties. Then, the switches are simplified to continuum structure which is discretized and simulated by the advanced RBF meshfree formulation. The system of equations is nonlinear because the nonlinear loading is calculated from coupled the electrostatic, the elastostatic, and the van der Waals energy domains. Besides the normal deformation analysis, the pull-in voltage characteristics of different nanoswitches based on the double-walled nanotubes are analyzed. Comparing with the results in the literature and from experiments, it has proven that the developed multiscale approach is accurate and efficient
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