Effect of nitrogen gas on the lifetime of carbon nanotube field emitters for electron-impact ionization mass spectrometry | Zendy

Stephanie Getty | Zendy; Rachael A. Bis | Zendy; S.E. Snyder | Zendy; Emily W. Gehrels | Zendy; Kristina Ramirez | Zendy; Todd King | Zendy; Patrick A. Roman | Zendy; P. R. Mahaffy | Zendy

Open Access

Effect of nitrogen gas on the lifetime of carbon nanotube field emitters for electron-impact ionization mass spectrometry

Author(s) -

Stephanie Getty,

Rachael A. Bis,

S.E. Snyder,

Emily W. Gehrels,

Kristina Ramirez,

Todd King,

Patrick A. Roman,

P. R. Mahaffy

Publication year - 2008

Publication title -

proceedings of spie, the international society for optical engineering/proceedings of spie

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.192

H-Index - 176

eISSN - 1996-756X

pISSN - 0277-786X

DOI - 10.1117/12.776914

Subject(s) - carbon nanotube , mass spectrometry , cathode , electron ionization , materials science , ionization , nitrogen , analytical chemistry (journal) , atomic physics , chemistry , nanotechnology , ion , physics , environmental chemistry , organic chemistry , chromatography

The lifetime of a patterned carbon nanotube film is evaluated for use as the cold cathode field emission ionization source of a miniaturized mass spectrometer. Emitted current is measured as a function of time for varying partial pressures of nitrogen gas to explore the robustness and lifetime of carbon nanotube cathodes near the expected operational voltages (70-100 eV) for efficient ionization in mass spectrometry. As expected, cathode lifetime scales inversely with partial pressure of nitrogen. Results are presented within the context of previous carbon nanotube investigations, and implications for planetary science mass spectrometry applications are discussed.

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