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Anti-reflective coating for multipatterning lithography
Author(s) -
Douglas J. Guerrero,
Stephen Gibbons,
Joyce Lowes,
Ramil Mercado
Publication year - 2008
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.772827
Subject(s) - resist , trench , lithography , materials science , scanner , anti reflective coating , coating , etching (microfabrication) , photolithography , optoelectronics , nanotechnology , photoresist , optics , physics , layer (electronics)
New bottom anti-reflective coatings (BARCs) have been developed that can be incorporated into multiple patterning schemes utilizing scanner-track-only processes. The BARCs have modifiable optical properties and can be removed during the resist development step. Several dual patterning schemes were investigated for trench printing. The most promising process produced 110 nm trenches with approximately 1:1 space ratios. The etch characteristics of these BARCs under fluorinated and oxygenated gases were determined.

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