Mechanical and thermal analysis of the spectroscopy x-ray telescopes for the Constellation-X mission
Author(s) -
Kai-Wing Chan,
Jeffrey Bolognese,
Timo T. Saha,
James Sturm,
William Zhang
Publication year - 2007
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.737180
Subject(s) - constellation , x ray telescope , metrology , optics , angular resolution (graph drawing) , spectroscopy , micrometer , x ray optics , materials science , telescope , physics , remote sensing , x ray , astronomy , geology , mathematics , combinatorics
Area and mass requirements for the Constellation-X Spectroscopy X-Ray Telescopes restrict the thickness of the mirror segment to below a mm. Requirement of angular resolution of 15" over the soft x-ray band implies that allowable optic deformation is sub-micrometer for these thin segments. These requirements place stringent constraint on the mounting, alignment and affixing of these mirror segments in both the metrology and integration processes. We present analyses and optimization of the Constellation-X mirrors under relevant mechanical and thermal environments.
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