Far-infrared blocked impurity band detector development | Zendy

Henry H. Hogue | Zendy; Matthew T. Guptill | Zendy; John Monson | Zendy; J. Stewart | Zendy; J. E. Huffman | Zendy; M. G. Mlynczak | Zendy; M. N. Abedin | Zendy

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Far-infrared blocked impurity band detector development

Author(s) -

Henry H. Hogue,

Matthew T. Guptill,

John Monson,

J. Stewart,

J. E. Huffman,

M. G. Mlynczak,

M. N. Abedin

Publication year - 2007

Publication title -

proceedings of spie, the international society for optical engineering/proceedings of spie

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.192

H-Index - 176

eISSN - 1996-756X

pISSN - 0277-786X

DOI - 10.1117/12.735123

Subject(s) - detector , optoelectronics , semiconductor detector , silicon , materials science , infrared , characterization (materials science) , semiconductor , germanium , optics , particle detector , nanotechnology , physics

DRS Sensors & Targeting Systems, supported by detector materials supplier Lawrence Semiconductor Research Laboratory, is developing far-infrared detectors jointly with NASA Langley under the Far-IR Detector Technology Advancement Partnership (FIDTAP). The detectors are intended for spectral characterization of the Earth's energy budget from space. During the first year of this effort we have designed, fabricated, and evaluated pilot Blocked Impurity Band (BIB) detectors in both silicon and germanium, utilizing pre-existing customized detector materials and photolithographic masks. A second-year effort has prepared improved silicon materials, fabricated custom photolithographic masks for detector process, and begun detector processing. We report the characterization results from the pilot detectors and other progress.

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