Scanners for analytic print measurement: the devil in the details | Zendy

Eric K. Zeise | Zendy; Don Williams | Zendy; Peter D. Burns | Zendy; William C. Kress | Zendy

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Scanners for analytic print measurement: the devil in the details

Author(s) -

Eric K. Zeise,

Don Williams,

Peter D. Burns,

William C. Kress

Publication year - 2007

Publication title -

proceedings of spie, the international society for optical engineering/proceedings of spie

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.192

H-Index - 176

eISSN - 1996-756X

pISSN - 0277-786X

DOI - 10.1117/12.705564

Subject(s) - distortion (music) , scanner , repeatability , computer science , computer vision , noise (video) , artificial intelligence , image quality , reflection (computer programming) , densitometer , computer graphics (images) , image resolution , image (mathematics) , optics , telecommunications , mathematics , bandwidth (computing) , statistics , amplifier , physics , programming language

Inexpensive and easy-to-use linear and area-array scanners have frequently substituted as colorimeters and densitometers for low-frequency (i.e., large area) hard copy image measurement. Increasingly, scanners are also being used for high spatial frequency, image microstructure measurements, which were previously reserved for high performance microdensitometers. In this paper we address characteristics of flatbed reflection scanners in the evaluation of print uniformity, geometric distortion, geometric repeatability and the influence of scanner MTF and noise on analytic measurements. Suggestions are made for the specification and evaluation of scanners to be used in print image quality standards that are being developed.

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