Open AccessResilience in all-optical label switching networks: a node dimensioning point of view
Author(s) -
Ruth Van Caenegem,
Didier Colle,
Mario Pickavet,
Piet Demeester
Publication year - 2005
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.634757
Subject(s) - dimensioning , node (physics) , resilience (materials science) , computer network , computer science , optical burst switching , optical switch , optical performance monitoring , distributed computing , wavelength division multiplexing , electronic engineering , engineering , materials science , optoelectronics , wavelength , composite material , aerospace engineering , structural engineering
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