Open AccessAutomation, operation, and data analysis in the cryogenic, high accuracy, refraction measuring system (CHARMS)
Author(s) -
Bradley J. Frey,
Douglas B. Leviton
Publication year - 2005
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.619302
Subject(s) - refraction , refractive index , optics , data reduction , wavelength , sampling (signal processing) , automation , range (aeronautics) , data center , remote sensing , computer science , physics , aerospace engineering , engineering , geology , mechanical engineering , detector , data mining , operating system
The Cryogenic High Accuracy Refraction Measuring System (CHARMS) at NASA's Goddard Space Flight Center has been enhanced in a number of ways in the last year to allow the system to accurately collect refracted beam deviation readings automatically over a range of temperatures from 15 K to well beyond room temperature with high sampling density in both wavelength and temperature. The engineering details which make this possible are presented. The methods by which the most accurate angular measurements are made and the corresponding data reduction methods used to reduce thousands of observed angles to a handful of refractive index values are also discussed.
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