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Technology development for the Constellation-X spectroscopy x-ray telescope
Author(s) -
Robert Petre,
John P. Lehan,
Stephen L. O’Dell,
Scott M. Owens,
Paul B. Reid,
Timo T. Saha,
Jeff Stewart,
W. D. Jones,
Wiiliam Zhang
Publication year - 2005
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.615172
Subject(s) - x ray telescope , angular resolution (graph drawing) , optics , telescope , x ray optics , physics , spectroscopy , spectral resolution , image resolution , imaging spectroscopy , computer science , remote sensing , astronomy , x ray , spectral line , mathematics , combinatorics , geology

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