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3D chemical mapping using terahertz pulsed imaging
Author(s) -
Yaochun Shen,
Philip F. Taday,
David Newnham,
Michael Kemp,
M. Pepper
Publication year - 2005
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.591472
Subject(s) - terahertz radiation , chemical imaging , materials science , explosive material , optics , pixel , terahertz time domain spectroscopy , waveform , fourier transform , explosive detection , sample (material) , terahertz spectroscopy and technology , optoelectronics , hyperspectral imaging , computer science , chemistry , radar , physics , artificial intelligence , telecommunications , organic chemistry , quantum mechanics , chromatography
We report the use of a terahertz pulsed imaging technique for three-dimensional chemical mapping. Terahertz radiation reflected from a sample was measured pixel-by-pixel in time domain using a terahertz pulsed imaging system developed at TeraView Ltd, UK. The recorded terahertz waveforms were then transformed into frequency domain using time-partitioned Fourier transform. Structural maps of samples were obtained by analyzing the terahertz time-domain data whilst chemical maps were obtained from terahertz spectral data sets. For a sample comprising chemical A at the surface of a polyethylene pellet and chemical B buried inside the pellet, we have separated the component spatial patterns of the two chemicals using their spectral fingerprints. The reconstructed three-dimensional chemical maps not only locate the chemicals in the object, but also identify each chemical. We also demonstrate the capabilities of terahertz pulsed imaging for non-destructive analysis of coating thickness and quality, and for detecting and identifying explosive materials such as RDX.

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