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Internal efficiency analysis of 280-nm light emitting diodes
Author(s) -
Joachim Piprek,
Craig G. Moe,
Sarah L. Keller,
Shuji Nakamura,
Steven P. DenBaars
Publication year - 2004
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.567084
Subject(s) - optoelectronics , light emitting diode , quantum efficiency , materials science , spontaneous emission , diode , wurtzite crystal structure , indium gallium nitride , wide bandgap semiconductor , quantum well , solid state lighting , band gap , optics , physics , laser , diffraction
Compact ultraviolet light sources are currently of high interest for a range of applications, including solid-state lighting, short-range communication, and bio-chemical detection. We report on the design and analysis of AlGaN-based light-emitting diodes with an emission wavelength near 280 nm. Internal device physics is investigated by three-dimensional numerical simulation. The simulation incorporates a drift-diffusion model for the carrier transport, built-in polarization, the wurtzite energy band-structure of strained quantum wells, as well as radiative and nonradiative carrier recombination. Critical material parameters are identified and their impact on the simulation results is investigated. Limitations of the internal quantum efficiency by electron leakage and nonradiative recombination are analyzed. Increasing the stopper layer bandgap is predicted to improve the quantum efficiency and the light output of our LED substantially.

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