Open Access<title>High-resolution surface plasmon measurements: a sensitive probe for thickness and structural information of ultrathin films</title>
Author(s) -
Uwe Albrecht,
Herbert Dilger,
Patrick Evers,
P. Leǐderer
Publication year - 1992
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.56648
Subject(s) - surface plasmon , materials science , plasmon , scattering , resolution (logic) , surface plasmon resonance , excited state , optics , optoelectronics , localized surface plasmon , nanotechnology , nanoparticle , atomic physics , physics , computer science , artificial intelligence
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