Characterization of adaptive optics at Keck Observatory: part II
Author(s) -
Marcos A. van Dam,
D. Le Mignant,
Bruce Macintosh
Publication year - 2004
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.552303
Subject(s) - adaptive optics , observatory , bandwidth (computing) , physics , optics , wavefront , noise (video) , detector , guide star , computer science , telecommunications , astrophysics , artificial intelligence , image (mathematics)
This paper is a continuation of the characterization of adaptive optics (AO) at Keck Observatory (SPIE 5169-01). The bandwidth and measurement noise error terms are often the important sources of wave-front error. Here, we show how the magnitude of these two terms is estimated. First, the Bayesian wave-front reconstructor employed at Keck Observatory is presented and shown to perform better than a conventional SVD reconstructor. A novel technique used to estimate the size of the spot on a Shack-Hartmann wave-front sensor quad cell detector is introduced, along with experimental results using this technique. The spot size is an essential component of the dynamic model of the AO system, which is presented and used to find the bandwidth and noise error terms.
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