JEM-X: the x-ray monitor on INTEGRAL | Zendy

C. BudtzJørgensen | Zendy; N. Lund | Zendy; N. J. Westergaard | Zendy; S. Brandt | Zendy; A. Hornstrup | Zendy; I. L. Rasmussen | Zendy; S. Laursen | Zendy; Søren Møller Pedersen | Zendy; Rene E. Kristansen | Zendy; P. B. Mögensen | Zendy; Kimberly Andersen | Zendy; J. Polny | Zendy; P. A. Jensen | Zendy; C. A. Oxborrow | Zendy; J. Chenevez | Zendy; K. Omoe | Zendy; Veikko J. Kamarainen | Zendy; Tor Andersson | Zendy; O. Vilhu | Zendy; J. Huovelin | Zendy; E. Costa | Zendy; M. Feroci | Zendy; A. Rubini | Zendy; E. Morelli | Zendy; Alfredo Morbidini | Zendy; F. Frontera | Zendy; Carlo Pelliciari | Zendy; G. Loffredo | Zendy; G. Zavattini | Zendy; V. Carassiti | Zendy; Marek Morawski | Zendy; G. Juchnikowski | Zendy; V. Reglero | Zendy; Juan Bautista Peris | Zendy; V. Collado | Zendy; J.M. Rodrigo | Zendy; F. Pérez | Zendy; Jose-Luis Requena | Zendy; S. Larsson | Zendy; Roger Svensson | Zendy; A. A. Zdziarski | Zendy; A. J. Castro–Tirado | Zendy; H. W. Schnopper | Zendy

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JEM-X: the x-ray monitor on INTEGRAL

Author(s) -

C. BudtzJørgensen,

N. Lund,

N. J. Westergaard,

S. Brandt,

A. Hornstrup,

I. L. Rasmussen,

S. Laursen,

Søren Møller Pedersen,

Rene E. Kristansen,

P. B. Mögensen,

Kimberly Andersen,

J. Polny,

P. A. Jensen,

C. A. Oxborrow,

J. Chenevez,

K. Omoe,

Veikko J. Kamarainen,

Tor Andersson,

O. Vilhu,

J. Huovelin,

E. Costa,

M. Feroci,

A. Rubini,

E. Morelli,

Alfredo Morbidini,

F. Frontera,

Carlo Pelliciari,

G. Loffredo,

G. Zavattini,

V. Carassiti,

Marek Morawski,

G. Juchnikowski,

V. Reglero,

Juan Bautista Peris,

V. Collado,

J.M. Rodrigo,

F. Pérez,

Jose-Luis Requena,

S. Larsson,

Roger Svensson,

A. A. Zdziarski,

A. J. Castro–Tirado,

H. W. Schnopper

Publication year - 2004

Publication title -

proceedings of spie, the international society for optical engineering/proceedings of spie

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.192

H-Index - 176

eISSN - 1996-756X

pISSN - 0277-786X

DOI - 10.1117/12.506791

Subject(s) - angular resolution (graph drawing) , physics , coded aperture , detector , optics , telescope , aperture (computer memory) , x ray telescope , full width at half maximum , x ray detector , resolution (logic) , field of view , sky , gamma ray , astronomy , astrophysics , computer science , artificial intelligence , acoustics , mathematics , combinatorics

The INTEGRAL X-ray monitor, JEM-X, (together with the two gamma ray instruments, SPI and IBIS) provides simultaneous imaging with arcminute angular resolution in the 3-35 keV band. The good angular resolution and low energy response of JEM-X plays an important role in the detection and identification of gamma ray sources as well as in the analysis and scientific interpretation of the combined X-ray and gamma ray data. JEM-X is a coded aperture X-ray telescope consisting of two identical detectors. Each detector has a sensitive area of 500 cm2, and views the sky through its own coded aperture mask. The coded masks are located 3.4 m above the detector windows. The detector field of view is constrained by X-ray collimators (6.6° FOV, FWHM).

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