Open Access<title>X-ray diffraction study of GaSb/AlSb strained-layer-superlattices grown on miscut (100) substrates</title>
Author(s) -
Albert T. Macrander,
Gary P. Schwartz,
Gregory J. Gualteri,
George H. Gilmer
Publication year - 1991
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.49473
Subject(s) - superlattice , optoelectronics , materials science , layer (electronics) , diffraction , optics , nanotechnology , physics
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