Effects of pulse duration on bulk laser damage in 350-nm raster-scanned DKDP
Author(s) -
Michael J. Runkel,
Justin R. Bruere,
Walter D. Sell,
Timothy L. Weiland,
D. Milam,
D. Hahn,
Mike C. Nostrand
Publication year - 2003
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.472051
Subject(s) - fluence , optics , raster scan , materials science , laser , pulse duration , pulse (music) , raster graphics , wavelength , pulse repetition frequency , optoelectronics , physics , detector , telecommunications , radar , artificial intelligence , computer science
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