Bidirectional reflectance distribution function and hemispherical reflectance of JSC MARS-1
Author(s) -
Georgi T. Georgiev,
James J. Butler
Publication year - 2002
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.461934
Subject(s) - bidirectional reflectance distribution function , optics , mars exploration program , remote sensing , monochromator , calibration , nist , scatterometer , radiometer , materials science , reflectivity , physics , geology , satellite , wavelength , astrobiology , computer science , astronomy , quantum mechanics , natural language processing
Novel data are presented of Bidirectional Reflectance Distribution Function (BRDF) and 8 o directional/hemispherical reflective measurements of Martian regolith simulant JSC Mars-1. The scatterometer of the National Aeronautics and Space Administration's Goddard Space Flight Center (NASA's GSFC) Diffuser Calibration Facility (DCaF) was used for the measurements reported. The data were obtained with a monochromator-based light source in the UltraViolet (UV), Visible (VIS), and Near InfraRed (NIR) spectral regions. The BRDF measurements were performed at different angles of incidence, and over a range of in-plane and out-of-plane geometries. The 8 o directional/hemispherical reflective measurements were calibrated using a gray Spectralon sample set of 7 plates. The results presented are NIST traceable through calibrated standard plates. The hemispherical and diffuse scatter data obtained from these studies are important for future Mars space and ground based observations.
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