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<title>System-level I/O power modeling</title>
Author(s) -
W. Pinello,
Pari Patel,
Yuang-Liang Li
Publication year - 2000
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.404882
Subject(s) - flexibility (engineering) , computer science , power (physics) , electric power system , modeling and simulation , signal integrity , reliability engineering , engineering , simulation , printed circuit board , mathematics , operating system , statistics , physics , quantum mechanics
A methodology is proposed for the electrical characterization of electronic packages in a system-level environment. Modeling and simulation results show the capability of the method by demonstrating both power delivery and I/O signal integrity analysis in a unified environment. In addition to flexibility, the proposed method is capable of achieving accurate results in a fraction of the time as was previously required.

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