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<title>Single-axis piezoceramic gimbal</title>
Author(s) -
Garnett C. Horner,
Barmac Taleghani
Publication year - 1999
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.351574
Subject(s) - gimbal , fabrication , materials science , finite element method , curvature , wafer , piezoelectricity , voltage , acoustics , structural engineering , engineering , composite material , physics , electrical engineering , optoelectronics , geometry , mathematics , aerospace engineering , medicine , alternative medicine , pathology
This paper describes the fabrication, testing, and analysis of a single axis piezoceramic gimbal. The fabrication process consists of pre-stressing a piezoceramic wafer using a high-temperature thermoplastic polyimide and a metal foil. The differential thermal expansion between the ceramic and metal induces a curvature. The pre-stressed, curved piezoceramic is mounted on a support mechanism and a mirror is attached to the piezoceramic. A plot of gimbal angle versus applied voltage to the piezoceramic is presented. A finite element analysis of the piezoceramic gimbal is described. The predicted gimbal angle versus applied voltage is compared to experimental results.

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