Open AccessSingle-beam photothermal microscopy: a new diagnostic tool for optical materials
Author(s) -
Zhouling Wu,
Michael D. Feit,
Mark R. Kozlowski,
Jean-Yves Natoli,
Alexander M. Rubenchik,
Lynn M. Sheehan,
Ming Yan
Publication year - 1999
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.344423
Subject(s) - photothermal therapy , materials science , optics , laser , photothermal spectroscopy , beam (structure) , microscopy , optoelectronics , laser beam quality , second harmonic generation , image resolution , laser beams , nanotechnology , physics
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