Open AccessLaser modulated scattering as a nondestructive evaluation tool for optical surfaces and thin film coatings
Author(s) -
Zhouling Wu,
Michael D. Feit,
Mark R. Kozlowski,
Alexander M. Rubenchik,
Lynn M. Sheehan
Publication year - 1999
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.344422
Subject(s) - materials science , scattering , optics , nondestructive testing , laser , characterization (materials science) , light scattering , optical coating , thin film , optoelectronics , nanotechnology , physics , quantum mechanics
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