Open AccessExtrapolation of damage test data to predict performance of large-area NIF optics at 355 nm
Author(s) -
Michael D. Feit,
Alexander M. Rubenchik,
Mark R. Kozlowski,
François Y. Génin,
Sheldon Schwartz,
Lynn M. Sheehan
Publication year - 1999
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.344413
Subject(s) - extrapolation , fluence , optics , laser , beam (structure) , aperture (computer memory) , test data , materials science , gaussian , physics , computer science , statistics , mathematics , quantum mechanics , acoustics , programming language
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