A hinged-pad test structure for sliding friction measurement in micromachining
Author(s) -
Maarten P. Boer,
James M. Redmond,
Terry A. Michalské
Publication year - 1998
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.324066
Subject(s) - hinge , cantilever , microelectromechanical systems , surface micromachining , fabrication , materials science , slip (aerodynamics) , structural engineering , mechanical engineering , mechanics , acoustics , engineering , composite material , nanotechnology , physics , medicine , alternative medicine , pathology , aerospace engineering
We describe the design, modeling, fabrication and initial testing of a new test structure for friction measurement in MEMS. The device consists of a cantilevered forked beam and a friction pad attached via a hinge. Compared to previous test structures, the proposed structure can measure friction over much larger pressure ranges, yet occupies ten to one hundred times less area. The placement of the hinge is crucial to obtaining a well-known and constant pressure distribution in the device. Static deflections on the device were measured and modeled numerically. Preliminary results indicate that friction pad slip is sensitive to friction pad normal force.
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