Open AccessTransient x-ray diffraction and its application to materials science and x-ray optics
Author(s) -
A. Hauer,
J. S. Wark,
D. H. Kalantar,
B. A. Remington,
R. A. Kopp,
J. A. Cobble,
B. Failor,
G. A. Kyrala,
Marc A. Meyers,
R. W. Springer,
T. R. Boehly
Publication year - 1997
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.283986
Subject(s) - diffraction , optics , pulsed power , plasma , laser , scattering , transient (computer programming) , shock wave , physics , field (mathematics) , x ray , materials science , power (physics) , computer science , nuclear physics , mathematics , pure mathematics , quantum mechanics , operating system , thermodynamics
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