<title>Significant improvements in Long Trace Profiler measurement performance</title>
Author(s) -
Peter Z. Takacs,
Cynthia J. Bresloff
Publication year - 1996
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.259878
Subject(s) - repeatability , bar (unit) , trace (psycholinguistics) , optics , enclosure , metrology , accuracy and precision , temperature measurement , instrumentation (computer programming) , calibration , observational error , physics , materials science , electrical engineering , mathematics , computer science , engineering , statistics , meteorology , linguistics , philosophy , quantum mechanics , operating system
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom