The effect of deposition process parameters on thin film coatings for the Athena X-ray optics
Author(s) -
Sonny Massahi,
Desirée Della Monica Ferreira,
Finn E. Christensen,
Nis C. Gellert,
Sara Svendsen,
Peter L. Henriksen,
Arne S. Jegers,
Maximilien J. Collon,
Boris Landgraf,
David Girou,
Aniket Thete,
Brian Shortt,
Ivo Ferreira,
Marcos Bavdaz,
Waldemar Schönberger,
Axel Langer
Publication year - 2021
Publication title -
technical university of denmark, dtu orbit (technical university of denmark, dtu)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1117/12.2594422
Subject(s) - thin film , materials science , surface roughness , coating , x ray optics , optical coating , substrate (aquarium) , silicon , deposition (geology) , optics , surface finish , composite material , optoelectronics , nanotechnology , x ray , physics , paleontology , oceanography , sediment , geology , biology
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