Measurement of thickness and elastic properties of electroactive polymer films using plate wave dispersion data | Zendy

Yoseph BarCohen | Zendy; Shyh-Shiuh Lih | Zendy; Anter El–Azab | Zendy; Ajit Mal | Zendy

Open Access

<title>Measurement of thickness and elastic properties of electroactive polymer films using plate wave dispersion data</title>

Author(s) -

Yoseph BarCohen,

Shyh-Shiuh Lih,

Anter El–Azab,

Ajit Mal

Publication year - 1996

Publication title -

proceedings of spie, the international society for optical engineering/proceedings of spie

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.192

H-Index - 176

eISSN - 1996-756X

pISSN - 0277-786X

DOI - 10.1117/12.259187

Subject(s) - polyethylene terephthalate , materials science , dispersion (optics) , polymer , electroactive polymers , composite material , thin film , polyethylene , optics , nanotechnology , physics

In this paper, an ongoing investigation of plate wave dispersion measurement as a technique for indirect determination of the elastic properties and thickness of electroactive thin film polymers is described. Three polymer films were tested: a 1 mm thick s-PMMA film, and 80 micrometers and 230 micrometers thick polyethylene terephthalate films. The dispersion curves are measured, and a numerical algorithm is applied to recover the thickness and elastic constants of these films. Preliminary results show that the technique can be a viable gauging tool for electroactive thin film polymers.

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