Open AccessCan phase masks extend depth-of-field in localization microscopy?
Author(s) -
Olivier Lévêque,
Caroline Kulcsár,
Hervé Sauer,
Antony Lee,
Pierre Bon,
Laurent Cognet,
François Goudail
Publication year - 2020
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1117/12.2558426
Subject(s) - microscope , microscopy , depth of field , optics , point spread function , optical microscope , resolution (logic) , super resolution microscopy , invariant (physics) , binary number , diffraction , exit pupil , phase (matter) , image resolution , computer science , computer vision , physics , artificial intelligence , mathematics , pupil , scanning confocal electron microscopy , scanning electron microscope , arithmetic , quantum mechanics , mathematical physics
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