Open AccessElectrical scanning probe microscopy approaches to investigate solar cell junctions and devices
Author(s) -
José Alvarez,
Clément Marchat,
Audrey Morisset,
Letian Dai,
JeanPaul Kleider,
Raphaël Cabal,
Pere Roca i Cabarrocas
Publication year - 2020
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1117/12.2540422
Subject(s) - materials science , heterojunction , optoelectronics , silicon , kelvin probe force microscope , band bending , amorphous silicon , strained silicon , surface photovoltage , nanotechnology , conductive atomic force microscopy , crystalline silicon , annealing (glass) , atomic force microscopy , composite material , physics , quantum mechanics , spectroscopy
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