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Fast label-free optical diffraction tomography compatible with conventional wide-field microscopes
Author(s) -
José A. Rodrigo,
Juan M. Soto,
Tatiana Alieva
Publication year - 2019
Publication title -
library open repository (universidad complutense madrid)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1117/12.2525840
Subject(s) - optics , microscope , speckle pattern , interferometry , deconvolution , diffraction , depth of field , speckle noise , tomographic reconstruction , tomography , phase contrast imaging , physics , phase contrast microscopy

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