Open Access<title>Advancement of x-ray microscopy technology and its application to metal solidification studies</title>
Author(s) -
William F. Kaukler,
Peter A. Curreri
Publication year - 1996
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.244353
Subject(s) - x ray , microscopy , projection (relational algebra) , resolution (logic) , materials science , image resolution , optics , contrast (vision) , optical microscope , microscope , high contrast , computer science , scanning electron microscope , artificial intelligence , composite material , physics , algorithm
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