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<title>Integrated CAD framework linking VLSI layout editors and process simulators</title>
Author(s) -
Chaitali Sengupta,
Miklós Erdélyi,
Zsolt Bor,
Joseph R. Cavallaro,
Michael C. Smayling,
Gábor Szabó,
Frank K. Tittel,
William L. Wilson
Publication year - 1996
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.240955
Subject(s) - very large scale integration , computer science , photolithography , cad , ic layout editor , process (computing) , integrated circuit layout , standard cell , integrated circuit , electronic circuit , optical proximity correction , electronic engineering , representation (politics) , feature (linguistics) , engineering drawing , computer architecture , engineering , embedded system , circuit extraction , electrical engineering , materials science , equivalent circuit , nanotechnology , voltage , operating system , linguistics , philosophy , politics , law , political science
As feature sizes in VLSI circuits extend into the far sub-micron range, new process techniques, such as using phase shifting masks for photolithography, will be needed. Under these conditions, the only means for the circuit designer to design compact and efficient circuits with good yield capabilities is to be able to see t he effect of different design approaches on manufactured silicon, instead of solely relying on conservative general design rules. The Integrated CAD Framework accomplishes this by providing a link between a layout editor (Magic), advanced photolithographic techniques such as phase shifted masks, and a process simulator (Depict). This paper discusses some applications of this tool. A non-conventional process technique involving interferometric phase shifting and off-axis illumination has been evaluated using the tool. Also, a feature of the CAD Framework which allows representation of a phase shifted mask, together with its layout analysis capability has been used to compact a piece of layout by inserting phase shifted elements into it.National Science Foundatio

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