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Sub-micron lines patterning into silica using water developable chitosan bioresist films for eco-friendly positive tone e-beam and UV lithography
Author(s) -
JeanLouis Leclercq,
Olivier Soppera,
Mathieu Caillau,
Céline Chevalier,
Pierre Crémillieu,
Thierry Delair,
Emmanuelle Laurenceau,
Yann Chevolot,
Benjamin Leuschel,
Cédric Ray,
Christophe Moulin,
Christian Jonin,
Emmanuel Bénichou,
Pierre-François Brevet,
Christelle Yeromonahos
Publication year - 2018
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1117/12.2292312
Subject(s) - resist , lithography , chitosan , materials science , electron beam lithography , photoresist , etching (microfabrication) , nanotechnology , immersion lithography , plasma etching , extreme ultraviolet lithography , x ray lithography , environmentally friendly , chemical engineering , optoelectronics , layer (electronics) , engineering , biology , ecology

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