Measurement of the nonlinear refractive index in optical thin films
Author(s) -
Morten Steinecke,
Detlev Ristau,
Marco Jupé,
Kevin Kiedrowski
Publication year - 2018
Publication title -
institutional repository of leibniz universität hannover (leibniz universität hannover)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1117/12.2281127
Subject(s) - refractive index , materials science , substrate (aquarium) , optics , interferometry , layer (electronics) , dielectric , nonlinear system , deformation (meteorology) , optoelectronics , composite material , physics , oceanography , quantum mechanics , geology
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