Single image super-resolution via regularized extreme learning regression for imagery from microgrid polarimeters
Author(s) -
Vijayan K. Asari,
Bradley M. Ratliff,
Garrett C. Sargent
Publication year - 2017
Publication title -
ohiolink etd center (ohio library and information network)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1117/12.2273945
Subject(s) - extreme learning machine , artificial intelligence , computer science , image resolution , pixel , computer vision , pattern recognition (psychology) , artificial neural network
The advantage of division of focal plane imaging polarimeters is their ability to obtain temporally synchronized intensity measurements across a scene; however, they sacrifice spatial resolution in doing so due to their spatially modulated arrangement of the pixel-to-pixel polarizers and often result in aliased imagery. Here, we propose a super-resolution method based upon two previously trained extreme learning machines (ELM) that attempt to recover missing high frequency and low frequency content beyond the spatial resolution of the sensor. This method yields a computationally fast and simple way of recovering lost high and low frequency content from demosaicing raw microgrid polarimetric imagery. The proposed method outperforms other state-of-the-art single-image super-resolution algorithms in terms of structural similarity and peak signal-to-noise ratio.
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