Open AccessAn analytical method for optimizing imaging parameters in industrial x-ray computed tomography for dimensional measurements on multimaterial workpieces
Author(s) -
Andrea Buratti,
Massimiliano Ferrucci,
Soufian Ben Achour,
Wim Dewulf,
Robert Schmitt
Publication year - 2016
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.2240566
Subject(s) - detector , computer science , metrology , tomography , optics , industrial computed tomography , monochromatic color , software , range (aeronautics) , dimensional metrology , materials science , physics , composite material , programming language
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