A toolbox of metrology-based techniques for optical system alignment | Zendy

Phillip Coulter | Zendy; Raymond G. Ohl | Zendy; Peter Blake | Zendy; Brent J. Bos | Zendy; Victor J. Chambers | Zendy; William L. Eichhorn | Zendy; Jeffrey S. Gum | Zendy; Theodore J. Hadjimichael | Zendy; John G. Hagopian | Zendy; Joseph E. Hayden | Zendy; Samuel Hetherington | Zendy; David A. Kubalak | Zendy; Kyle F. Mclean | Zendy; Joseph McMann | Zendy; Kevin Redman | Zendy; Henry P. Sampler | Zendy; Greg Wenzel | Zendy; Jerrod L. Young | Zendy

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A toolbox of metrology-based techniques for optical system alignment

Author(s) -

Phillip Coulter,

Raymond G. Ohl,

Peter Blake,

Brent J. Bos,

Victor J. Chambers,

William L. Eichhorn,

Jeffrey S. Gum,

Theodore J. Hadjimichael,

John G. Hagopian,

Joseph E. Hayden,

Samuel Hetherington,

David A. Kubalak,

Kyle F. Mclean,

Joseph McMann,

Kevin Redman,

Henry P. Sampler,

Greg Wenzel,

Jerrod L. Young

Publication year - 2016

Publication title -

proceedings of spie, the international society for optical engineering/proceedings of spie

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.192

H-Index - 176

eISSN - 1996-756X

pISSN - 0277-786X

DOI - 10.1117/12.2239070

Subject(s) - toolbox , metrology , aerospace , computer science , spacecraft , systems engineering , variety (cybernetics) , aerospace engineering , optics , engineering , artificial intelligence , physics , programming language

The NASA Goddard Space Flight Center (GSFC) and its partners have broad experience in the alignment of flight optical instruments and spacecraft structures. Over decades, GSFC developed alignment capabilities and techniques for a variety of optical and aerospace applications. In this paper, we provide an overview of a subset of the capabilities and techniques used on several recent projects in a “toolbox” format. We discuss a range of applications, from small-scale optical alignment of sensors to mirror and bench examples that make use of various large-volume metrology techniques. We also discuss instruments and analytical tools.

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