Open Access<title>Microdiffraction measurements of the effects of grain alignment on critical current in high-temperature superconductors</title>
Author(s) -
E. D. Specht,
A. Goyal
Publication year - 1995
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.221671
Subject(s) - materials science , crystallite , optics , grain boundary , optoelectronics , microstructure , physics , metallurgy
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