Temperature-dependent refractive index measurements of CaF2, Suprasil 3001, and S-FTM16 for the Euclid near-infrared spectrometer and photometer
Author(s) -
Douglas B. Leviton,
Kevin H. Miller,
Manuel A. Quijada,
F. Grupp
Publication year - 2015
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.2189024
Subject(s) - refractive index , photometer , optics , spectrometer , materials science , wavelength , infrared , dispersion (optics) , lens (geology) , refraction , physics
Using the Cryogenic High Accuracy Refraction Measuring System (CHARMS) at NASA’s Goddard Space Flight Center, we measured absolute refractive indices at temperatures from 100 to 310 K at wavelengths from 0.42 to 3.6 microns for CaF2, Suprasil 3001 fused silica, and S-FTM16 glass in support of lens designs for the Near Infrared Spectrometer and Photometer (NISP) for ESA’s Euclid dark energy mission. We report absolute refractive index, dispersion (dn/dλ), and thermo-optic coefficient (dn/dT) for these materials. In this study, materials from different melts were procured to understand index variability in each material. We provide temperature-dependent Sellmeier coefficients based on our data to allow accurate interpolation of index to other wavelengths and temperatures. For calcium fluoride (CaF2) and S-FTM16, we compare our current measurements with CHARMS measurements of these materials made in the recent past for other programs. We also compare Suprasil 3001’s indices to those of other forms of fused silica we have measured in CHARMS.
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